DAC-44 notes
Friday Jun 15, 2007
I was at the DAC (Design Automation Conf.), the biggest trade conference in the EDA industry held at San Diego last week. Presented a paper from my PhD research work (shameless plug to my dissertation summary). Overall it was a very exciting conference. Here are some of the notes I made from the sessions I sat in during DAC last week.
Tuesday: 06/05
- Panel Session: Mega Trends and EDA 2017
- Moore's law will continue for next 10 yrs; corollary is
the law for manycore processors (might see 500+).
- EDA/semicon industry for next 10 yrs will be at 8%
(single digit) growth; Not the era of 14-15% growth of
90's.
- Industry in "golden age" after initial stage of
irruption, tech bubble, etc.
- More interaction/convergence b/w foundries and EDA tools
companies
- Power, DFM, DFY major issues, but not show-stoppers;
consensus that solutions will be found.
- Application driver may not be consumer electronics but
healthcare, auto, etc. (Juan Antonio Cabarallo, Aragon
Venture)
- Convergence of design platforms; consolidation across
semicon and EDA companies (Cabarallo)
- Will see emergence of more application software
development (perf. optimizers, tuners, etc) by EDA
companies (Prof. Kurt Keutzer, Berkeley)
- Techeconomics will drive the respective industries (Aart
de Gaeus, Synopsys)
- Moore's law will continue for next 10 yrs; corollary is
- 2. Paper session: Leakage Power Analysis and Optimization
- Paper #3: modeled dependence of Vt on width, useful in
the context of wider transistors.
- Paper #3: modeled dependence of Vt on width, useful in
- 3. Panel session: Early power-aware design and validation, myth or
reality
- Consensus that it is largely a reality as several
designs use it successfully
- No consensus on what accuracy can/will be achieved
- Data quality bad in arch.-level power but early
power-aware design does help and works in real design.
Start with the following: i. Arch. performance model ii. Block-level activity from simulator, iii. Switching cap extrapolate from previous generation design
- Silicon within 10% arch. estimates obtained with
intensive high-level modeling effort (Steve Curtis,
Intel)
- High-level power estimation/opt tools confined to
startups; big EDA companies not betting on it since not
sure when system-level design will take off (E. Macii,
Univ. Torino)
- Lack of standard format for exchanging power info;
Accellera UPF expected to make things better
- Limited availability of info. for characterizing power
models because knowledge of the IP is needed (companies
not ready to share)
- Consensus that it is largely a reality as several
Wednesday: 06/06
- Paper session: Process-aware physical design
- Paper #1: proposes buffer insertion under process
variations. First, do slew-constrained buffering, then
iteratively check timing and do delay-constrained
buffering until timing is satisfied.
- Paper #1: proposes buffer insertion under process
Thursday: 06/07
- Special Session: Thousand core chips
- Shekar Borkar, Intel:
- 45nm can integrate 8 bil transistors; 2014 we
will hit terascale (100 bil); integration
capability will facilitate 1K cores in 10 yrs
- transistors moving to trigate; delay and energy
scaling will slow down; 1.25x realistic freq.
scaling; 0.7x vdd scaling; 1000 core chips will
have 1000w of power
- Pollacks rule: in single core, 2x (power or
area) = 1.4x perf.
- multi-core chips will have general purpose,
special purpose procs and connected by
interconnect fabric; opportunity for
fine-grained pwr. mgmt. in multicore; parallel
s/w key to multicore success.
- Having many small cores will give better
performance but parallelism in applications
should double every generation to break even;
means that s/w shd be able to parallelize better
- How to feed the beast? 100GBps BW may be needed.
I/O power at this rate will be 25W using ~400
differential pins. Reduce distance between cores
to abt. 1-2mm; 3d chips with DRAM on bottom
probably best solution.
- Resilient uarch in manycore needed because
components will get more and more unreliable
(soft errors, variability, aging, etc.);
possible solutions: dynamic on-chip testing,
redundancy, etc.
- 45nm can integrate 8 bil transistors; 2014 we
- Anant Agarwal, MIT:
- KILL rule for multicore (Kill if less than
linear): A resource in a core (power or area)
must be inc. in area only if the core's perf.
improvement is more than the inc. in the
resource.
- KILL rule for multicore (Kill if less than
- Wen-Mei Hwu, UIUC:
- Parallel prog models needed for >4 cores. Models
should last for many generations of multicore. -
- Implicitly parallel prog implies APIs managing
parallelism. Explicitly parallel prog implies
programmers managing parallelism. In former,
algorithm should be parallel but can be written
in seq. language. Latter is rigid (need to
change as # of cores multiply) and not
advisable.
- Parallel prog models needed for >4 cores. Models
- 4. John Deringer, IBM (EDA for Multi-core):
- Growing use of diverse modular design
- EDA challenges: custom design efficiency,
ASIC-style productivity, design and verification
- Growing use of diverse modular design
- Shekar Borkar, Intel:










